Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression
نویسندگان
چکیده
A methodology for the determination of decompression hardware that guarantees complete fault coverage for a unified compaction/compression scheme is proposed. Test cube information is utilized for the determination of a near optimal decompression hardware. The proposed scheme attains simultaneously high compression levels and reduced pattern counts through a linear decompression hardware. Significant test volume and test application time reductions are delivered through the scheme we propose while a highly cost effective hardware implementation is retained.
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